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Design-for-test Technical Publications
Titles include * Embedded Deterministic Test for Low Cost Manufacturing (ITC 2002) * Reducing Simulation Mismatches in Design-for-Test (DFT) Implementation * TestKompress with EDT Technology: Reducing Time and Expense in Test * Embedded Deterministic Test - DFT Technology for Low-Cost IC Manufacturing Test * Using FastScan Diagnostics to Improve Time-to-Volume
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DFT Digest.com
Hi! My name is John Ford, and I write this blog. I have been working in this industry for a little over 23 years (gasp!) in various engineering capacities: test (digital and mixed-signal), DFT, verification, and some design automation. I like doing a variety of things. The bulk of my career has been in Southern California, for companies such as Western Digital, Silicon Systems, and Texas Instruments. Just recently I worked for...
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