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association
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Design-for-Debug Consortium
The DFD Consortium brings together electronic design automation (EDA), automated board test (ATE), and design for test (DFT) providers with semiconductor and systems companies driving development and adoption of emerging DFD methodologies, software tools, and intellectual property offerings.
preview:
http://www.designfordebug.org
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association
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Semiconductor Test Consortium
The Semiconductor Test Consortium was founded in 2003 to develop a common test architecture that is completely open, documented and supported via solutions available from all ATE vendors.
Open to all companies throughout the semiconductor supply chain with a vested interest in the test sector, the consortium is focused on providing value-added standards that deliver technical & economic benefits to the global semiconductor industry.
preview:
http://www.semitest.org
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portal
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www.boundary-scan.co.uk
Thank you for visiting our web-site.
We hope that the information gathered here will provide an introduction and help to ‘de-mystify’ the technologies of boundary-scan (aka JTAG and IEEE 1149). The technology pages deal with the nuts & bolts of the main standard IEEE 1149.1 or ‘dot 1’ for short and also newer emerging standards such as IEEE 1149.6 ‘dot 6’ and also IEEE 1532 or ‘ISC’. (In-system configuration). The application...
preview:
http://www.boundary-scan.co.uk
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newsgroup
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Design For Test Forum
Design For Test Forum The forum is to discuss everything related to Design For Test Skip to content Advanced search HomeBoard index Change font size FAQ Register Login It is currently Wed Apr 02, 2008 11:54 pm View unanswered posts • View active topics Forum Topics Posts Last post Discussions Wanna discuss the past, the present and future of DFT. Confused on which tool and menthodology to use. All such discussion go here....
preview:
http://dft.semiconductorforums.com
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vendor
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Courses & Consulting on Digital Design-For-Test
Bennetts Associates is a UK-based consultancy specialising in Design-For-Test (DFT), covering the design and application of Internal Scan, BIST and Boundary Scan to electronics devices, boards and system.
The principal partner is Dr R G 'Ben' Bennetts, a DFT engineer with over 35 years experience in the electronics design and test industry.
preview:
http://www.dft.co.uk
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tool
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UrJTAG - Universal JTAG Library, Server, and Tools
UrJTAG aims to create an enhanced, modern tool for communicating over JTAG with flash chips, CPUs, and many more.
It takes on the well proven openwince jtag tools code.
Future plans include conversion of the code base into a library that can be used with other applications.
A flexible remote communication
preview:
http://www.urjtag.org
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publication
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IEEE Design and Test of Computers
Offers original works describing the methods used to design and test electronic product hardware and supportive software.
The magazine focuses on current and near-future practice, and includes tutorials, how-to articles, and real-world case studies.
preview:
http://www.computer.org
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